Automation of measurements of photoelectric parameters of high-impedance semiconductor films

Authors

  • B.S. Dzundza Vasyl Stefanyk Precarpathian National University
  • V.V. Prokopiv Vasyl Stefanyk Precarpathian National University
  • T.M. Mazur Vasyl Stefanyk Precarpathian National University
  • L.D. Yurchyshyn Vasyl Stefanyk Precarpathian National University

DOI:

https://doi.org/10.15330/pcss.19.4.363-367

Keywords:

electrical parameters, photoconductivity, automation, microcontroller

Abstract

A method of measuring electrical conductivity and photoconductivity of semiconductor films with high electrical resistance has been described. The electric circuit has been presented and the computer program has been developed. That provides automation of measurements, registration and primary processing of data with possibility of plotting time dependences for preliminary analysis of experimental data during measurement.

References

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T. M. Razykov, K. M. Kuchkarov, B. A. Ergashev, A. Khubbimov, M. K. Khakkulov, Effect of chloride treatment on the electrophysical properties of CdTe films obtained by the XMPO method. Conference dedicated to the 80th anniversary of Academician M.S. Saidov (Tashkent, 2010). Pp. 265.

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N. F. Kovtonyuk, Measurement of parameters of semiconductor materials (Metallurgy, Moscow, 1970).

Yu. V. Klevkov, S. A. Kolosov, A. F. Plotnikov, Physics and Technology of Semiconductors 41(6) 323 (2007).

Published

2018-12-25

How to Cite

Dzundza, B., Prokopiv, V., Mazur, T., & Yurchyshyn, L. (2018). Automation of measurements of photoelectric parameters of high-impedance semiconductor films . Physics and Chemistry of Solid State, 19(4), 363–367. https://doi.org/10.15330/pcss.19.4.363-367

Issue

Section

Scientific articles

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