The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST

Authors

  • B.S. Dzundza Vasyl Stefanyk Precarpathian National University
  • O.B. Kostyuk Vasyl Stefanyk Prekarpathian University
  • V.I. Makovyshyn Vasyl Stefanyk Prekarpathian University

DOI:

https://doi.org/10.15330/pcss.17.3.368-371

Keywords:

size effect, thin film, lead telluride, thermoelectric properties

Abstract

The thermoelectric properties of thin films based on compounds PbSnAgTe, obtained by condensation of vapor on the high vacuum on mica substrate are researched. Based on a two-layer model Petrits are founded electrical parameters of surface layers. It is shown that condensates thickness d < 500 nm are characterized by improved thermoelectric properties.

References

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[6] M.A. Lop"yanko, S.I. Mudryy, S.V. Optanasyuk, T.O. Semko, T.S. Lyuba, H.D. Mateyik, I.V. Horichok, Ya.S. Yavors'kyy, Physics and Chemistry of Solid State 17(2), 193 (2016).
[7] M.A. Ruvins'kyy, O.B. Kostyuk, B.S. Dzundza, Journal of nano- i electronic physics 8(2), 02051 (2016).

Published

2016-09-15

How to Cite

Dzundza, B., Kostyuk, O. ., & Makovyshyn, V. (2016). The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST. Physics and Chemistry of Solid State, 17(3), 368–371. https://doi.org/10.15330/pcss.17.3.368-371

Issue

Section

Scientific articles

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