REVUTSKA, L.; SHYLENKO, O.; STRONSKI, A.; KOMANICKY, V.; BILANYCH, V. Electron-beam recording of surface structures on As-S-Se chalcogenide thin films. Physics and Chemistry of Solid State, [S. l.], v. 21, n. 1, p. 146–150, 2020. DOI: 10.15330/pcss.21.1.146-150. Disponível em: https://journals.pnu.edu.ua/index.php/pcss/article/view/2968. Acesso em: 24 nov. 2024.