NOVOSYADLIY, S.P.; GRYGA, V.M.; KURYSH, I.I.; MELNYK , M.I. Thermal Field Stabilization of the Threshold Voltage of the Field Transistors of the Submicron Technology of the LSI. Physics and Chemistry of Solid State, [S. l.], v. 19, n. 4, p. 352–357, 2018. DOI: 10.15330/pcss.19.4.352-357. Disponível em: https://journals.pnu.edu.ua/index.php/pcss/article/view/590. Acesso em: 21 nov. 2024.