TUR, Y.; PAVLOVSKYI, Y.; VIRT, I. Measurement of Thermoelectric Parameters of Thin-Film Semiconductor Materials Using the Harman Method. Physics and Chemistry of Solid State, [S. l.], v. 20, n. 3, p. 306–310, 2019. DOI: 10.15330/pcss.20.3.306-310. Disponível em: https://journals.pnu.edu.ua/index.php/pcss/article/view/624. Acesso em: 24 nov. 2024.