MANKO, D. Yu.; BELIAK, Ie. V.; BUTOK, O. M.; CHEHIL, Yu. I.; PANKRATOVA, A. V.; KRYUCHYN, A. A. Analysis of methods for detecting opaque defects on the surface of modulation disks (review). Physics and Chemistry of Solid State, [S. l.], v. 26, n. 2, p. 358–369, 2025. DOI: 10.15330/pcss.26.2.358-369. Disponível em: https://journals.pnu.edu.ua/index.php/pcss/article/view/9071. Acesso em: 5 dec. 2025.