DZUNDZA, B.S.; KOSTYUK, O.B.; MAKOVYSHYN, V.I. The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST. Physics and Chemistry of Solid State, [S. l.], v. 17, n. 3, p. 368–371, 2016. DOI: 10.15330/pcss.17.3.368-371. Disponível em: https://journals.pnu.edu.ua/index.php/pcss/article/view/1250. Acesso em: 18 jul. 2024.