Khoverko Yu.М.; Shcherban N.О. Electrical Conductivity and Magnetoresistance of Silicon Microstructures in the Vicinity to Metal-Insulator Transition . Physics and Chemistry of Solid State, [S. l.], v. 19, n. 3, p. 246–253, 2019. DOI: 10.15330/pcss.19.3.246-253. Disponível em: https://journals.pnu.edu.ua/index.php/pcss/article/view/474. Acesso em: 3 may. 2024.