DZUNDZA, B.S.; PROKOPIV, V.V.; MAZUR, T.M.; YURCHYSHYN, L.D. Automation of measurements of photoelectric parameters of high-impedance semiconductor films . Physics and Chemistry of Solid State, [S. l.], v. 19, n. 4, p. 363–367, 2018. DOI: 10.15330/pcss.19.4.363-367. Disponível em: https://journals.pnu.edu.ua/index.php/pcss/article/view/592. Acesso em: 18 jul. 2024.