Novosiadly, S.P., T.H. Benko, and I.T. Kogut. 2019. “Features of Electrophysical Diagnostics of Schottky Field Transistors Based on GaAs Epitaxial Layers on Silicon Substrates for Microsystem Applications”. Physics and Chemistry of Solid State 20 (3):311-17. https://doi.org/10.15330/pcss.20.3.311-317.