Tur, Y., Y. Pavlovskyi, and I. Virt. “Measurement of Thermoelectric Parameters of Thin-Film Semiconductor Materials Using the Harman Method”. Physics and Chemistry of Solid State 20, no. 3 (October 19, 2019): 306–310. Accessed April 26, 2024. https://journals.pnu.edu.ua/index.php/pcss/article/view/624.