Tur Y, Pavlovskyi Y, Virt I. Measurement of Thermoelectric Parameters of Thin-Film Semiconductor Materials Using the Harman Method. Phys.Chem.Sol.State [Internet]. 2019 Oct. 19 [cited 2024 Nov. 24];20(3):306-10. Available from: https://journals.pnu.edu.ua/index.php/pcss/article/view/624