Manko DY, Beliak IV, Butok OM, Chehil YI, Pankratova AV, Kryuchyn AA. Analysis of methods for detecting opaque defects on the surface of modulation disks (review). Phys.Chem.Sol.State [Internet]. 2025 Jun. 24 [cited 2025 Dec. 5];26(2):358-69. Available from: https://journals.pnu.edu.ua/index.php/pcss/article/view/9071