Dzundza B, Prokopiv V, Mazur T, Yurchyshyn L. Automation of measurements of photoelectric parameters of high-impedance semiconductor films . Phys. Chem. Sol. State [Internet]. 2018 Dec. 25 [cited 2024 Apr. 25];19(4):363-7. Available from: https://journals.pnu.edu.ua/index.php/pcss/article/view/592