Structural properties of Ga18Ge20.9Te61.2 alloys

  • M.V. Popovych V.E. Lashkarev Institute of Semiconductor Physics NAS of Ukraine, Kyiv, Ukraine
  • A.V. Stronski V.E. Lashkarev Institute of Semiconductor Physics NAS of Ukraine, Kyiv, Ukraine
  • K.V. Shprtko V.Lashkaryov Institute of Semiconductor Physics NAS Ukraine, Kyiv, Ukraine
Keywords: chalcogenide glasses, X-ray diffraction, radial distribution function, Raman spectroscopy, nanophases


In this paper,  amorphous Ga18Ge20.9Te61.2   alloys have been studied using the X-ray diffraction and Raman spectroscopy methods. The experimental X-ray diffraction patterns were used for calculations of  radial distribution functions that indicate positions of the nearest-neighbour bond lengths r= 2.67 Å and second-neighbour bond length r2 = 4.27 Å. The similar r1-values were observed for Ga-Ge-Te glasses of other compositions. The bands observed in the Raman spectra of Ga18Ge20.9Te61.2   samples show that this glass contains different nanophases, which can be explained using the terms of vibration modes inherent to Ga-Te and Ge-Te glasses, as well as films. Investigations of compositional dependences of characteristic constituent Raman bands intensities, which change with the composition should be studied in order to obtain better assignment of Raman bands.


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How to Cite
PopovychM., Stronski A., & ShprtkoK. (2022). Structural properties of Ga18Ge20.9Te61.2 alloys. Physics and Chemistry of Solid State, 23(4), 830-835.
Scientific articles (Physics)