X-ray diffractometric study of HDPE/GaAs and HDPE/GaAs<Te> composites

Authors

  • N.N. Gadzhieva Institute of Radiation Problems of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan
  • G.B. Ahmadova Institute of Physics of of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan
  • S.Z. Melikova Institute of Radiation Problems of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan
  • F.G. Asadov Institute of Radiation Problems of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan

DOI:

https://doi.org/10.15330/pcss.24.1.23-25

Keywords:

high density polyethylene, GaAs, GaAs<Te>, composites, X-ray diffractometry method

Abstract

High-density polyethylene sheets (HDPE), HDPE/GaAs and HDPE/ GaAs<Te>  composites with GaAs and GaAs<Te> semiconductor fillers were studied by X-ray diffractometry at room temperature. The degree of crystallization of these samples was calculated and it was determined that the inclusion of fillers in the polymer matrix (x=1-10% composite) leads to an increase in the degree of crystallization by 1.3-1.4 times. The obtained results are explained by the change of the upper molecular structure of the polymer.

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Published

2023-02-23

How to Cite

Gadzhieva, N., Ahmadova, G., Melikova, S., & Asadov, F. (2023). X-ray diffractometric study of HDPE/GaAs and HDPE/GaAs<Te> composites. Physics and Chemistry of Solid State, 24(1), 23–25. https://doi.org/10.15330/pcss.24.1.23-25

Issue

Section

Scientific articles (Physics)