X-ray diffractometric study of HDPE/GaAs and HDPE/GaAs<Te> composites

N.N. Gadzhieva; G.B. Ahmadova; S.Z. Melikova; F.G. Asadov

doi:10.15330/pcss.24.1.23-25

Authors

N.N. Gadzhieva Institute of Radiation Problems of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan
G.B. Ahmadova Institute of Physics of of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan
S.Z. Melikova Institute of Radiation Problems of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan
F.G. Asadov Institute of Radiation Problems of Ministry of Science and Education Republic of Azerbaijan, Baku, Azerbaijan

DOI:

https://doi.org/10.15330/pcss.24.1.23-25

Keywords:

high density polyethylene, GaAs, GaAs<Te>, composites, X-ray diffractometry method

Abstract

High-density polyethylene sheets (HDPE), HDPE/GaAs and HDPE/ GaAs<Te> composites with GaAs and GaAs<Te> semiconductor fillers were studied by X-ray diffractometry at room temperature. The degree of crystallization of these samples was calculated and it was determined that the inclusion of fillers in the polymer matrix (x=1-10% composite) leads to an increase in the degree of crystallization by 1.3-1.4 times. The obtained results are explained by the change of the upper molecular structure of the polymer.

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