Crystallographic Features of Nanostructures SnTe on Polyimide
DOI:
https://doi.org/10.15330/pcss.16.1.79-82Keywords:
tin telluride, atomic force microscopy, crystallographyAbstract
It is done the statistical analysis of crystallographic angles of surface elements of tin telluride films deposited on a substrate of polyimide by open evaporation in a vacuum. Analysis of images obtained by atomic force microscope revealed the influence of technological factors on the features of shape and spatial orientation of surface islands. It is shown that the islands are a dome-shaped with changing the ratio of the width to the lateral diameter. Weak dependence of symmetry islands on the deposition conditions is revealed.
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