Simulation the spectral dependence of the transmittance for semiconductor thin films

H. Il'chuk; A. Kashuba; R. Petrus; I. Semkiv; N. Ukrainets

doi:10.15330/pcss.21.1.57-60

Authors

H. Il'chuk Lviv Polytechnic National University
A. Kashuba National University “Lvivska Politechnika”
R. Petrus National University “Lvivska Politechnika”
I. Semkiv National University “Lvivska Politechnika”
N. Ukrainets National University “Lvivska Politechnika”

DOI:

https://doi.org/10.15330/pcss.21.1.57-60

Keywords:

thin films, bandgap, optical functions, transmission, reflectance

Abstract

The spectral dependence of the transmittance as a function of the film thickness, the refractive index of the substrate, bandgap and the Cauchy parameters (α and β) of the semiconductor material was determined from condition of interference extremes. The absorption coefficient was simulated for the structure – thin film/substrate. Cadmium chalcogenides (CdTe, CdSe, and CdS) deposited on quartz substrates was selected as model samples. Experimental behavior of substrate transmittance was used to determine its refractive index. The theoretical results are compared with the experimental data and shows good agreement.

References

L.I. Nykyruy, R.S. Yavorskyi, Z.R. Zapukhlyak, G. Wisz, P. Potera, Optical Materials 92, 319 (2019) (https://doi.org/10.1016/j.optmat.2019.04.029).

R. Swanepoel, J. Phys. E: Sci. Instrum. 16, 1214 (1983) (https://doi.org/10.1088/0022-3735/16/12/023).

J. Sanchez-Gonzalez, A. Diaz-Parralejo, A.L. Ortiz, F. Guiberteau, Appl. Surf. Sci. 252, 6013 (2006) (https://doi.org/10.1016/j.apsusc.2005.11.009).

R. Yavorskyi, L. Nykyruy, G. Wisz, P. Potera, S. Adamiak, Sz. Górny, Applied Nanoscience 9, 715 (2018) (https://doi.org/10.1007/s13204-018-0872-z).

V.V. Brus, L.J. Pidkamin, S.L. Abashin, Z.D. Kovalyuk, P.D. Maryanchuk, O.M. Chugai. Optical Materials 34, 1940 (2012) (https://doi.org/10.1016/j.optmat.2012.06.007).

C. Baban, G.I. Rusu, P. Prepelita, Journal of Optoelectronics and Advanced Materials 7, 817 (2005).

W. Ming-Dong, Z. Dao-Yun, L. Yi, Z. Lin, Z. Chang-Xi, H. Zhen-Hui, C. Di-Hu, W. Li-Shi, Chin. Phys. Lett. 25, 743 (2008) (https://doi.org/10.1088/0256-307X/25/2/106).

N. Bouchenak Khelladi, N.E. Chabane Sari, Advances in Materials Science 13, 21 (2013) (doi:10.2478/adms-2013-0003).

P. Lucas, Optical materials. Measurement of optical properties of solids (Encyclopedia of Modern Optics, Elsevier, 2004).

R.Yu. Petrus, H.A. Ilchuk, A.I. Kashuba, I.V. Semkiv, E.O. Zmiiovska, R.M. Lys, Physics and Chemistry of Solid State 20, 367 (2019) (https://doi.org/10.15330/pcss.20.4.367-371).

R.Yu. Petrus, H.A. Ilchuk, A.I. Kashuba, I.V. Semkiv, E.O. Zmiiovska, F.M. Honchar, J. App. Spectr. 87, 46 (2020).

R.Yu. Petrus, H.A. Ilchuk, A.I. Kashuba, I.V. Semkiv, E.O. Zmiiovska, Optics and Spectroscopy 126, 220 (2019) (https://doi.org/10.1134/S0030400X19030160).

H.A. Ilchuk, R.Y. Petrus, A.I. Kashuba, I.V. Semkiv, E.O. Zmiiovska, Nanosistemi, Nanomateriali, Nanotehnologii 16, 519 (2018).

G.A. Il’chuk, R.Yu. Petrus, A.I. Kashuba, I.V. Semkiv, E.O. Zmiiovs’ka, Optics and Spectroscopy 128, 50 (2020).