Synthesis and Electrical Properties of Ag8SnSe6 Argyrodite Thin Films
DOI:
https://doi.org/10.15330/pcss.18.1.78-83Keywords:
argyrodite, X-ray diffraction, electrochemical cell, impedance spectroscopy, cyclic voltammetryAbstract
The synthesis of Ag8SnSe6 argyrodite thin films with thickness 500 nm by selenization of Ag-Sn film at 480 oC was carried out. Thin films were investigated by X-ray diffraction. Ternary Ag8SnSe6 synthesized in orthorhombic structure with the lattice parameters a = 7.9081(6) Å, b = 7.8189(7) Å, c = 11.0464(9) Å, V = 683.03(10) Å3. Resistive switching cell based on Ag8SnSe6 argyrodite with silver and graphite electrodes was fabricated. Electrical properties of cell were investigated using impedance spectroscopy and cyclic voltammetry. Cell structure and process in this cell were modeled by electric equvivalent circuit. Resistive switching phenomena in Ag/Ag8SnSe6/C cell at certain applied voltage were demonstrated.
References
[1] R. Waser and M. Aono, Nature Materials 6, 833 (2007).
[2] A. Sawa, Materials Today 11, 28 (2008).
[3] R. Waser, R. Dittmann, G. Staikov and K. Szot., Adv. Mater. 21, 2632 (2009).
[4] Z. Guo, M.-Q. Li, J.-H. Liu, and X.-J. Huang, Small, 11(47), 6285 (2015).
[5] K. Terabe, T. Hasegawa, T. Nakayama, M. Aono, Nature 433, 47 (2005).
[6] M. Mitkova, M.N. Kozicki, J. Non-Cryst. Solids 299-302, 1023 (2002).
[7] M. Mitkova, M.N. Kozicki, H.C. Kim, T.L. Alford, Thin Solid Films 449, 248 (2004).
[8] M.N. Kozicki, M. Park, M. Mitkova, IEEE T-NANO 4, 331 (2005).
[9] Patent No 111131 Ukraine, M.V.Cheylo et.al. Reg. No a201406222; publ. 10.11.2016, Bul. No 21.
[10] K.-W. Cheng, Y.-H. Wu, T.-H. Chiu, Journal of Power Sources 307, 329 (2016).
[11] Y. Shi, H. Li and L.-J. Li, Chem. Soc. Rev. 44, 2744 (2015).
[12] K.-W. Cheng, C.-H. Yeh, International Journal of Hydrogen Energy 37, 13638 (2012).
[13] F. O. Adurodija, J. Song, S.D. Kim, S. H. Kwon, S. K. Kim, K. H. Yoon, B. T. Ahn, Thin Solid Films 338, 13 (1999).
[14] І. V. Semkiv, А. І. Kashuba, H. A. Ilchuk, M. V. Chekaylo, Physics and Chemistry of Solid State, 16(2), 257 (2015).
[15] I. V. Semkiv, B. A. Lukiyanets, H. A. Ilchuk, R. Yu. Petrus, A. I. Kashuba, M. V. Chekaylo, Journal of Nano- and Electronic Physics 8(1), 01011 (2016).
[16] І. V. Semkiv, Physics and Chemistry of Solid State, 17(3), 346 (2016).
[17] I. V. Semkiv, H. A. Ilchuk, A. I. Kashuba, R. Yu. Petrus, V. V. Kusnezh, Journal of Nano- and Electronic Physics 8(3), 03005 (2016).
[18] S. V. Syrotyuk, I. V. Semkiv, H. A. Ilchuk, V. M. Shved, Condensed Matter Physics 19(4), 43703 (2016).
[19] I. Karakaya and W. T. Thompson, Bull. Alloy Phase Diagrams 8, 340 (1987).
[20] STOE & Cie GmbH, WinXPOW 3.03, Powder Diffraction Software Package, Darmstadt, Germany, 2010.
[21] R. A. Young, IUCr Monographs on Crystallography (Oxford University Press, New York, 1993).
[22] J. Rodriguez-Carvajal, Newsletter 26, 12 (2001).
[23] T. Roisnel, J. Rodriguez-Carvajal, Mater. Sci. Forum, 118, 378 (2001).
[24] L. D. Gulay, I. D. Olekseyuk, O. V. Parasyuk, J. Alloys Compd. 339, 113 (2002).
[25] R. Waser, I. Valov. ECS Transactions 25(6), 431 (2009).
[26] K. J. Yoon, M. H. Lee, G. H. Kim, S. J. Song, J. Y. Seok, S. Han, J. H. Yoon, K. M. Kim and C. S. Hwang, Nanotechnology 23, 185202 (2012).
[2] A. Sawa, Materials Today 11, 28 (2008).
[3] R. Waser, R. Dittmann, G. Staikov and K. Szot., Adv. Mater. 21, 2632 (2009).
[4] Z. Guo, M.-Q. Li, J.-H. Liu, and X.-J. Huang, Small, 11(47), 6285 (2015).
[5] K. Terabe, T. Hasegawa, T. Nakayama, M. Aono, Nature 433, 47 (2005).
[6] M. Mitkova, M.N. Kozicki, J. Non-Cryst. Solids 299-302, 1023 (2002).
[7] M. Mitkova, M.N. Kozicki, H.C. Kim, T.L. Alford, Thin Solid Films 449, 248 (2004).
[8] M.N. Kozicki, M. Park, M. Mitkova, IEEE T-NANO 4, 331 (2005).
[9] Patent No 111131 Ukraine, M.V.Cheylo et.al. Reg. No a201406222; publ. 10.11.2016, Bul. No 21.
[10] K.-W. Cheng, Y.-H. Wu, T.-H. Chiu, Journal of Power Sources 307, 329 (2016).
[11] Y. Shi, H. Li and L.-J. Li, Chem. Soc. Rev. 44, 2744 (2015).
[12] K.-W. Cheng, C.-H. Yeh, International Journal of Hydrogen Energy 37, 13638 (2012).
[13] F. O. Adurodija, J. Song, S.D. Kim, S. H. Kwon, S. K. Kim, K. H. Yoon, B. T. Ahn, Thin Solid Films 338, 13 (1999).
[14] І. V. Semkiv, А. І. Kashuba, H. A. Ilchuk, M. V. Chekaylo, Physics and Chemistry of Solid State, 16(2), 257 (2015).
[15] I. V. Semkiv, B. A. Lukiyanets, H. A. Ilchuk, R. Yu. Petrus, A. I. Kashuba, M. V. Chekaylo, Journal of Nano- and Electronic Physics 8(1), 01011 (2016).
[16] І. V. Semkiv, Physics and Chemistry of Solid State, 17(3), 346 (2016).
[17] I. V. Semkiv, H. A. Ilchuk, A. I. Kashuba, R. Yu. Petrus, V. V. Kusnezh, Journal of Nano- and Electronic Physics 8(3), 03005 (2016).
[18] S. V. Syrotyuk, I. V. Semkiv, H. A. Ilchuk, V. M. Shved, Condensed Matter Physics 19(4), 43703 (2016).
[19] I. Karakaya and W. T. Thompson, Bull. Alloy Phase Diagrams 8, 340 (1987).
[20] STOE & Cie GmbH, WinXPOW 3.03, Powder Diffraction Software Package, Darmstadt, Germany, 2010.
[21] R. A. Young, IUCr Monographs on Crystallography (Oxford University Press, New York, 1993).
[22] J. Rodriguez-Carvajal, Newsletter 26, 12 (2001).
[23] T. Roisnel, J. Rodriguez-Carvajal, Mater. Sci. Forum, 118, 378 (2001).
[24] L. D. Gulay, I. D. Olekseyuk, O. V. Parasyuk, J. Alloys Compd. 339, 113 (2002).
[25] R. Waser, I. Valov. ECS Transactions 25(6), 431 (2009).
[26] K. J. Yoon, M. H. Lee, G. H. Kim, S. J. Song, J. Y. Seok, S. Han, J. H. Yoon, K. M. Kim and C. S. Hwang, Nanotechnology 23, 185202 (2012).
Downloads
Published
2017-03-15
How to Cite
Semkiv, I., Ukrainets, N., Kusnezh, V., Zmiiovska, E., Petrus, R., Ilchuk, H., & Dubiv, T. (2017). Synthesis and Electrical Properties of Ag8SnSe6 Argyrodite Thin Films. Physics and Chemistry of Solid State, 18(1), 78–83. https://doi.org/10.15330/pcss.18.1.78-83
Issue
Section
Scientific articles
