The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST

  • B.S. Dzundza Vasyl Stefanyk Precarpathian National University
  • O.B. Kostyuk Vasyl Stefanyk Prekarpathian University
  • V.I. Makovyshyn Vasyl Stefanyk Prekarpathian University
Keywords: size effect, thin film, lead telluride, thermoelectric properties

Abstract

The thermoelectric properties of thin films based on compounds PbSnAgTe, obtained by condensation of vapor on the high vacuum on mica substrate are researched. Based on a two-layer model Petrits are founded electrical parameters of surface layers. It is shown that condensates thickness d < 500 nm are characterized by improved thermoelectric properties.

References

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Published
2016-09-15
How to Cite
Dzundza, B., Kostyuk, O., & Makovyshyn, V. (2016). The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST. Physics and Chemistry of Solid State, 17(3), 368-371. https://doi.org/10.15330/pcss.17.3.368-371
Section
Scientific articles

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