Automation of measurements of photoelectric parameters of high-impedance semiconductor films

  • B.S. Dzundza Vasyl Stefanyk Precarpathian National University
  • V.V. Prokopiv Vasyl Stefanyk Precarpathian National University
  • T.M. Mazur Vasyl Stefanyk Precarpathian National University
  • L.D. Yurchyshyn Vasyl Stefanyk Precarpathian National University
Keywords: electrical parameters, photoconductivity, automation, microcontroller

Abstract

A method of measuring electrical conductivity and photoconductivity of semiconductor films with high electrical resistance has been described. The electric circuit has been presented and the computer program has been developed. That provides automation of measurements, registration and primary processing of data with possibility of plotting time dependences for preliminary analysis of experimental data during measurement.

References

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Published
2018-12-25
How to Cite
[1]
DzundzaB., ProkopivV., MazurT. and YurchyshynL. 2018. Automation of measurements of photoelectric parameters of high-impedance semiconductor films . Physics and Chemistry of Solid State. 19, 4 (Dec. 2018), 363-367. DOI:https://doi.org/10.15330/pcss.19.4.363-367.
Section
Scientific articles

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